Scanning and Transmission Electron Microscopy An Introduction

by ; ;
Edition: Reprint
Format: Hardcover
Pub. Date: 1993-09-23
Publisher(s): Oxford University Press
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Summary

This authoritative volume, ideal for use in the laboratory, presents the practical and theoretical fundamentals of scanning and transmission electron microscopy--together in one convenient volume. Clear and concise explanations coupled with instructive diagrams and photographs guide youthrough microscope operation, image production, analytical techniques, and potential applications to various disciplines. Specimen preparation is discussed in detail, with emphasis on specific parameters for biological specimens. Since each laboratory has its own procedures, this unique bookcovers the essentials of scanning and transmission electron microscopy while leaving the laboratory particulars to individual discretion. Unmatched in scope and clarity--and filled with helpful diagrams, photographs, and drawings--this text offers the best introduction to scanning and transmissionelectron microscopy available. Due to its comprehensive coverage, the book will serve as an ideal course text in the electron microscopy classes organized for the benefit of advanced students in both the biological and physical sciences.

Author Biography


Stanley L. Flegler, John W. Heckman, Jr., and Karen L. Klomparens are at the Center for Electron Optics at Michigan State University.

Table of Contents

Preface vii
Introduction
1(12)
Electron Sources and Electon Lenses
13(10)
Electron Sources
13(6)
Electron Lenses
19(4)
Vacuum Systems
23(20)
Vacuum Pumps Commonly Used in EM Labs
26(9)
Methods of Measuring Vacuums
35(3)
Vacuum Systems Used in Electron Microscopy
38(5)
The Transmission Electron Microscope
43(22)
Theory of Operation
44(2)
Real Images
46(1)
Virtual Images
47(1)
Depth of Field and Depth of Focus
48(1)
Anatomy of a Transmission Electron Microscope
49(14)
Medium- and High-Voltage Transmission Electron Microscopy
63(2)
The Scanning Electron Microscope
65(32)
Theory of Operation
67(4)
Specimen-Beam Interactions
71(11)
Machine Variables
82(7)
Ultrahigh-Resolution SEMS
89(1)
Environmental SEMS
89(1)
Scanning Transmission Electron Microscopes
90(3)
Scanning Tunneling and Atomic Force Microscopy
93(4)
Specimen Preparation for Tem
97(54)
Negative Staining of Small Particulates
98(2)
Ultrathin Sectioning of Larger Samples
100(26)
Vacuum Evaporators and Evaporation Techniques
126(6)
Shadowcasting and Replica Techniques
132(10)
Cytological Techniques
142(6)
Preparation of Nonbiological Materials
148(3)
Specimen Preparation for Sem
151(22)
Mounting
152(1)
Coating for Conductivity
153(5)
Special Methods for Various Sample Types
158(1)
Biological Sample Preparation
159(3)
Alternative Methods for Biological Samples
162(5)
SEM Histochemistry for Biological Samples
167(6)
X-Ray Analysis
173(28)
X-ray Production and Naming
174(3)
Measuring the Energy and Wavelength of X Rays
177(1)
Construction of the EDS Detector
178(2)
Construction of the EDS X-Ray Analyzer
180(2)
Outputs
182(1)
Spectrum Accumulation and Interpretation
182(3)
Optimizing the Detection of X Rays
185(2)
Artifacts
187(4)
Quantitative Analysis
191(5)
Sample Preparation
196(5)
Electron Micrographic Techniques
201(20)
Silver Graphic Process
202(3)
Photographic Printing
205(3)
Transmission Electron Micrography
208(5)
Scanning Electron Micrography
213(2)
The Electronic Darkroom
215(2)
Micrograph Presentation and Publication
217(4)
Index 221

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