High Speed Cmos Design Styles,9780792382201

High Speed Cmos Design Styles

by ; ; ; ; ;
ISBN13: 9780792382201
ISBN10: 079238220X
Format: Hardcover
Pub. Date: 1998-07-01
Publisher(s): Kluwer Academic Pub
  • Free Shipping Icon

    This Item Qualifies for Free Shipping!*

    *Excludes marketplace orders.

List Price: $262.49

Rent Textbook

Select for Price
Add to Cart
There was a problem. Please try again later.

Rent Digital

Rent Digital Options
Online:30 Days access
Downloadable:30 Days
$57.24
Online:60 Days access
Downloadable:60 Days
$76.32
Online:90 Days access
Downloadable:90 Days
$95.40
Online:120 Days access
Downloadable:120 Days
$114.48
Online:180 Days access
Downloadable:180 Days
$124.02
Online:1825 Days access
Downloadable:Lifetime Access
$190.80
$124.02
Add to Cart

New Textbook

We're Sorry
Sold Out

Used Textbook

We're Sorry
Sold Out

Buy from our Marketplace starting at $5.50

How Marketplace Works:

  • This item is offered by an independent seller and not shipped from our warehouse
  • Item details like edition and cover design may differ from our description; see seller's comments before ordering.
  • Sellers much confirm and ship within two business days; otherwise, the order will be cancelled and refunded.
  • Marketplace purchases cannot be returned to eCampus.com. Contact the seller directly for inquiries; if no response within two days, contact customer service.
  • Additional shipping costs apply to Marketplace purchases. Review shipping costs at checkout.

Summary

High Speed CMOS Design Styles is written for the graduate-level student or practicing engineer who is primarily interested in circuit design. It is intended to provide practical reference, or `horse-sense', to mechanisms typically described with a more academic slant. This book is organized so that it can be used as a textbook or as a reference book. High Speed CMOS Design Styles provides a survey of design styles in use in industry, specifically in the high speed microprocessor design community. Logic circuit structures, I/O and interface, clocking, and timing schemes are reviewed and described. Characteristics, sensitivities and idiosyncrasies of each are highlighted. High Speed CMOS Design Styles also pulls together and explains contributors to performance variability that are associated with process, applications conditions and design. Rules of thumb and practical references are offered. Each of the general circuit families is then analyzed for its sensitivity and response to this variability. High Speed CMOS Design Styles is an excellent source of ideas and a compilation of observations that highlight how different approaches trade off critical parameters in design and process space.

Table of Contents

Preface v
CHAPTER 1 Process Variability
1(50)
1.1 Introduction
1(5)
1.1.1 Inter-Die Variations: Across-Lot and Across-Wafer Variation
2(3)
1.1.2 Intra-Die Variation
5(1)
1.1.3 Fail Causes
5(1)
1.2 Front-End-Of-Line Variability Considerations
6(19)
1.2.1 Short Channel Effects and ACLV
6(4)
1.2.2 NFET to PFET Length Tracking
10(1)
1.2.3 Channel Width Effects
11(2)
1.2.4 Device Threshold Voltage Variation
13(1)
1.2.5 Mobile Charge
13(2)
1.2.6 Hot Carriers
15(4)
1.2.7 Drain Resistance Modulation
19(1)
1.2.8 Negative Bias Temperature Instability (NBTI)
20(1)
1.2.9 Body Effect
21(1)
1.2.10 Other Process Parameters
22(3)
1.3 Charge Loss Mechanisms
25(11)
1.3.1 Subthreshold Leakage Currents
26(1)
1.3.2 Junction Leakage
27(2)
1.3.3 Field-induced Leakage Mechanisms
29(1)
1.3.4 Alpha Particle and Cosmic Ray Interactions
30(2)
1.3.5 Defect Leakage
32(4)
1.4 Back-End-Of-Line Variability Considerations
36(11)
1.4.1 Wire Resistance
38(3)
1.4.2 Line Width/Space
41(2)
1.4.3 Dielectric Thickness and Permittivity
43(1)
1.4.4 Wire Thickness
44(1)
1.4.5 Contact Resistance
45(2)
1.5 Summary
47(4)
CHAPTER 2 Non-Clocked Logic Styles
51(40)
2.1 Introduction
51(3)
2.2 Static CMOS Structures
54(4)
2.2.1 Static Combinatorial CMOS Logic
55(2)
2.2.2 Pulsed Static Logic (PS-CMOS)
57(1)
2.3 DCVS Logic
58(7)
2.3.1 Differential Cascode Voltage-Switched Logic (DCVSL)
59(2)
2.3.2 Differential Split Level Logic (DSL)
61(2)
2.3.3 Cascode Non-Threshold Logic (CNTL)
63(1)
2.3.4 DCVS Circuit Family Process Sensitivities
64(1)
2.4 Non-Clocked Pass-Gate Families
65(21)
2.4.1 CMOS Pass Gate (PG) and Transmission Gate (TG) Logic
68(3)
2.4.2 DCVS Logic with the Pass Gate (DCVSPG)
71(2)
2.4.3 Complementary Pass Gate Logic (CPL)
73(3)
2.4.4 Swing-Restored Pass Gate Logic (SRPL)
76(2)
2.4.5 Energy-Economized Pass Transistor Logic (EEPL)
78(1)
2.4.6 Push-pull Pass transistor Logic (PPL)
79(2)
2.4.7 Single-Ended Pass-Gate Logic (LEAP)
81(3)
2.4.8 Double Pass-Transistor Logic (DPL)
84(1)
2.4.9 Pass-Gate Circuit Family Process Sensitivities
85(1)
2.5 Summary
86(5)
CHAPTER 3 Clocked Logic Styles
91(42)
3.1 Introduction
91(2)
3.2 Single-Rail Domino Logic Styles
93(14)
3.2.1 Domino CMOS
93(5)
3.2.2 Multiple Output Domino Logic (MODL)
98(2)
3.2.3 Compound Domino Logic
100(1)
3.2.4 Noise Tolerant Precharge Logic (NTP)
101(1)
3.2.5 Clock-Delayed Domino (CD Domino)
102(2)
3.2.6 Self-Resetting Domino (SRCMOS)
104(3)
3.3 Alternating-Polarity Domino Approaches
107(4)
3.3.1 NORA
108(2)
3.3.2 Zipper Domino
110(1)
3.4 Dual-Rail Domino Structures
111(6)
3.4.1 Differential Domino
111(1)
3.4.2 Cross-Coupled Domino
112(2)
3.4.3 Modified Dual-Rail Domino (MDDCVSL)
114(1)
3.4.4 Dynamic Differential Split Level Logic (DDSL)
115(1)
3.4.5 Pseudo-Clocked Domino
115(2)
3.5 Latched Domino Structures
117(7)
3.5.1 Sample-Set Diffential Logic (SSDL)
117(2)
3.5.2 Enable/Disable CMOS Differential Logic (ECDL)
119(2)
3.5.3 Latch Domino (LDomino)
121(1)
3.5.4 Differential Current Switch Logic (DCSL)
122(1)
3.5.5 Switched Output Differential Structure (SODS)
123(1)
3.6 Clocked Pass-Gate Logic
124(4)
3.6.1 Dynamic Complementary Pass Gate Logic (DCPL)
125(2)
3.6.2 Sense-Amplifying Pipeline Flip-Flop (SA-F/F) Scheme
127(1)
3.7 Summary
128(5)
CHAPTER 4 Circuit Design Margin and Design Variability
133(42)
4.1 Introduction
133(1)
4.2 Process Induced Variation
134(15)
4.2.1 Static CMOS Logic
134(5)
4.2.2 Dynamic Domino Logic
139(4)
4.2.3 Pass Gate Logic
143(4)
4.2.4 Differential Cascode Voltage Switch Logic (DCVS)
147(2)
4.3 Design Induced Variation
149(4)
4.3.1 Intermediate Charge and Charge Sharing
149(1)
4.3.2 Timing Collisions
150(1)
4.3.3 Data Dependent Capacitance
151(1)
4.3.4 Die Size Consideration
152(1)
4.4 Application Induced Variation
153(4)
4.4.1 VDD Tolerance Effects
153(3)
4.4.2 Temperature Tolerance Effects
156(1)
4.5 Noise
157(12)
4.5.1 Capacitive Coupling (Crosstalk)
157(2)
4.5.2 Delay Noise
159(1)
4.5.3 Logic Noise
160(7)
4.5.4 Transmission Lines
167(1)
4.5.5 Simultaneous Switching
167(1)
4.5.6 Soft Errors
168(1)
4.6 Design Margin Budgeting
169(2)
4.7 Summary
171(4)
CHAPTER 5 Latching Strategies
175(32)
5.1 Introduction
175(2)
5.2 Basic Latch Design
177(7)
5.2.1 Storage Elements
177(2)
5.2.2 Static and Dynamic Latches
179(1)
5.2.3 Latch Clocking
180(2)
5.2.4 Noise/Robust Design
182(2)
5.2.5 Latch Implementation
184(1)
5.3 Latching Single-Ended Logic
184(7)
5.3.1 pseudo Inverter Latch
185(1)
5.3.2 True Single Phase Clocking (TSPC)
186(3)
5.3.3 Double-Edge-Triggered Flip-Flops (DETFF
189(2)
5.4 Latching Differential Logic
191(5)
5.4.1 DCVS Latches
191(1)
5.4.2 Static Ram Latches
192(1)
5.4.3 Ratio Insensitive Differential Latch
193(1)
5.4.4 Differential Flip-Flops
194(2)
5.5 Race Free Latches for Precharged Logic
196(4)
5.5.1 Cross-Coupled Differential Output
197(1)
5.5.2 Negative Setup Pipeline Latch
198(2)
5.6 Asynchronous Latch Techniques
200(4)
5.6.1 SRCMOS Latch
200(2)
5.6.2 Muller C-element
202(1)
5.6.3 Asynchronous TSPC ETL
203(1)
5.7 Summary
204(3)
CHAPTER 6 Interface Techniques
207(40)
6.1 Introduction
207(3)
6.2 Signaling Standards
210(2)
6.3 Chip-to-chip Communication Networks
212(7)
6.4 ESD Protection
219(3)
6.5 Driver Design Techniques
222(12)
6.6 Receiver Design Techniques
234(8)
6.7 Summary
242(5)
CHAPTER 7 Clocking Styles
247(38)
7.1 Introduction
247(1)
7.2 Clock Jitter and Skew
248(4)
7.2.1 Clock Jitter
248(1)
7.2.2 Clock Skew
249(1)
7.2.3 Total Clock Inaccuracy
249(2)
7.2.4 Clocks and Noise Generation
251(1)
7.3 Clock Generation
252(3)
7.3.1 PLL Based Designs
252(1)
7.3.2 Off-Chip Oscillator Based Design
253(1)
7.3.3 Delay Locked Loops
254(1)
7.3.4 Phase Splitters
254(1)
7.3.5 Clock Chopping
255(1)
7.4 Clock Distribution
255(18)
7.4.1 Clock Distribution Techniques
258(1)
7.4.2 Distributed buffers, placement optimization and standard wiring
258(1)
7.4.3 Water-main Clock Distribution Technique
258(1)
7.4.4 H-Tree Clock Distribution Technique
259(3)
7.4.5 Grid Clock Distribution Technique
262(1)
7.4.6 Length matched serpentines
262(1)
7.4.7 Hybrid Clock Distribution Techniques
263(1)
7.4.8 Comparison of the Industry's Best Clock Distribution Networks
263(1)
7.4.9 Network Topologies
264(1)
7.4.10 Grids
265(2)
7.4.11 Trees
267(1)
7.4.12 Length-Matched Serpentines
268(1)
7.4.13 Comparisons
269(1)
7.4.14 A 400 MHz Clock Tree Design
270(2)
7.4.15 Clock Distribution Techniques Summary
272(1)
7.5 Single Phase Clocking
273(7)
7.5.1 Single-Phase Master-Slave Design
273(3)
7.5.2 Single Phase Separated Latch Design
276(2)
7.5.3 Clock Activates Logic and Opens Subsequent Latch
278(1)
7.5.4 Clock Opens Latch and Activates Subsequent Logic
278(2)
7.5.5 Single Phase Continuously Latching Design
280(1)
7.6 Multi-Phase Clocking
280(1)
7.6.1 Two Phase Clocking
281(1)
7.6.2 Four Phase Strategies
281(1)
7.7 Asynchronous Techniques
281(1)
7.8 Summary
282(3)
CHAPTER 8 Slack Borrowing and Time Stealing
285(50)
8.1 Introduction
285(1)
8.2 Slack Borrowing
286(26)
8.2.1 Slack Borrowing in Symmetric 50% Duty Cycle 2-Phase Systems
288(13)
8.2.2 Phase Partitioning in Symmetric 50% Duty Cycle 2-Phase Systems
301(4)
8.2.3 Slack Borrowing and Phase Partitioning in Asymmetric 2-Phase Systems
305(1)
8.2.4 Slack Borrowing Examples
306(4)
8.2.5 Looping Effects on Slack Borrowing
310(2)
8.3 Time Stealing
312(21)
8.3.1 Time Stealing for Dynamic Logic in Symmetric 50% Duty Cycle 2-Phase Non-Overlapping Systems
314(10)
8.3.2 Time Stealing for Dynamic Logic in Symmetric 2-Phase Overlapping Systems
324(2)
8.3.3 Time Stealing for Dynamic Logic in Asymmetric 2-Phase Systems
326(1)
8.3.4 Time Stealing in Master-Slave Systems
326(4)
8.3.5 Time Stealing from a Previous Cycle or Phase
330(2)
8.3.6 Looping Effects on Time Stealing
332(1)
8.4 Summary
333(2)
CHAPTER 9 Future Technology
335(12)
9.1 Introduction
335(1)
9.2 Classical Scaling Theory
335(2)
9.3 Industry Trends Define Scaling Law
337(1)
9.3.1 De-Facto Scaling
337(1)
9.4 Challenges Presented by I/S Scaling
338(2)
9.4.1 VT non-scaling
338(1)
9.4.2 Gate Lithography
339(1)
9.4.3 Gate Dielectric
339(1)
9.4.4 Interconnect Delays and Noise
340(1)
9.5 Possible Directions
340(7)
INDEX 347

An electronic version of this book is available through VitalSource.

This book is viewable on PC, Mac, iPhone, iPad, iPod Touch, and most smartphones.

By purchasing, you will be able to view this book online, as well as download it, for the chosen number of days.

Digital License

You are licensing a digital product for a set duration. Durations are set forth in the product description, with "Lifetime" typically meaning five (5) years of online access and permanent download to a supported device. All licenses are non-transferable.

More details can be found here.

A downloadable version of this book is available through the eCampus Reader or compatible Adobe readers.

Applications are available on iOS, Android, PC, Mac, and Windows Mobile platforms.

Please view the compatibility matrix prior to purchase.