An Introduction to Mixed-Signal Ic Test and Measurement

by ;
Format: Hardcover
Pub. Date: 2000-12-14
Publisher(s): Oxford University Press
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Summary

Integrated circuits incorporating both digital and analog functions have become increasingly prevalent in the semiconductor industry. Mixed-signal IC test and measurement has grown into a highly specialized field of electrical engineering. However, test engineering is still a relativelyunknown profession compared to IC design engineering. It has become harder to hire and train new engineers to become skilled mixed-signal test engineers. The slow learning curve for mixed-signal test engineers is largely due to the shortage of written materials and university-level courses on thesubject of mixed-signal testing. While many textbooks have been devoted to the subject of digital test and testability, the same cannot be said for analog and mixed-signal automated test and measurement. An Introduction to Mixed-Signal IC Test and Measurement is a textbook for advanced undergraduate and graduate-level students as well as engineering professionals. It was written in response to the shortage of basic course material for mixed-signal test and measurement. The book assumes a solidbackground in analog and digital circuits as well as a working knowledge of computers and computer programming. A background in digital signal processing and statistical analysis is also helpful, though not absolutely necessary. This text encompasses the testing of both analog and mixed-signal circuits including many borderline examples. Digital testing is covered, but not as extensively because of the wealth of information on this topic already available. Examples and illustrations using state-of-the-art industrialtechnology enrich and enliven the presentation throughout. In considering the applications of this technology, the testing of large-scale mixed-signal circuits and individual circuits is introduced. The value-added benefits of mixed-signal IC testing to a manufacturer's product are clearlydiscussed, and the role of the test engineer is clearly defined.

Table of Contents

Preface xvii
Overview of Mixed-Signal Testing
Mixed-Signal Circuits
1(4)
Analog, Digital, or Mixed-Signal?
1(1)
Common Types of Analog and Mixed-Signal Circuits
2(1)
Applications of Mixed-Signal Circuits
3(2)
Why Test Mixed-Signal Devices?
5(5)
The CMOS Fabrication Process
5(1)
Real-World Circuits
5(3)
What Is a Test Engineer?
8(2)
Post-Silicon Production Flow
10(1)
Test and Packaging
10(1)
Characterization versus Production Testing
11(1)
Test And Diagnostic Equipment
11(5)
Automated Test Equipment
11(2)
Wafer Probers
13(1)
Handlers
13(1)
E-Beam Probers
14(1)
Focused Ion Beam Equipment
15(1)
Forced-Temperature Systems
15(1)
New Product Development
16(1)
Concurrent Engineering
16(1)
Mixed-Signal Testing Challenges
17(6)
Time to Market
18(1)
Accuracy, Repeatability, and Correlation
18(1)
Electromechanical Fixturing Challenges
18(1)
Economics of Production Testing
19(4)
The Test Specification Process
Device Data Sheets
23(8)
Purpose of a Data Sheet
23(1)
Structure of a Data Sheet
24(3)
Electrical Characteristics
27(4)
Generating the Test Plan
31(1)
To Plan or Not to Plan
31

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