Abbreviations |
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ix | (2) |
Preface |
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xi | |
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1. Why STEM?--STEM versus TEM |
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1 | (10) |
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1 | (3) |
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4 | (1) |
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4 | (1) |
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4 | (1) |
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5 | (1) |
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5 | (4) |
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5 | (1) |
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6 | (2) |
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Analysis of biological macromolecules |
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8 | (1) |
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9 | (1) |
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9 | (2) |
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11 | (16) |
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11 | (1) |
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12 | (4) |
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14 | (1) |
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15 | (1) |
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Differential pumping apertures (DPAs) |
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15 | (1) |
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Virtual objective aperture (VOA) |
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15 | (1) |
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16 | (1) |
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16 | (3) |
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Condenser alignment and stigmator |
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16 | (1) |
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Condenser lenses (C1, C2) |
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17 | (1) |
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18 | (1) |
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18 | (1) |
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Selected area diffraction (SAD) aperture |
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19 | (1) |
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19 | (3) |
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Objective/condenser stigmator |
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19 | (1) |
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20 | (1) |
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21 | (1) |
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21 | (1) |
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Post-specimen optics and detectors |
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22 | (3) |
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Secondary electron detector |
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22 | (1) |
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Post-specimen alignment coils |
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23 | (1) |
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23 | (1) |
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Annular dark field (ADF) detector |
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23 | (1) |
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Diffraction pattern observation screen (DPOS) |
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24 | (1) |
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24 | (1) |
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Bright field (BF) detector |
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25 | (1) |
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X-ray and energy loss spectrometers |
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25 | (1) |
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26 | (1) |
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27 | (10) |
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27 | (3) |
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27 | (1) |
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27 | (2) |
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29 | (1) |
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30 | (3) |
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33 | (1) |
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34 | (1) |
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35 | (2) |
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37 | (18) |
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37 | (1) |
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General discussion of probe forming |
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38 | (3) |
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A few numbers and formulae (facts and figures) |
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39 | (2) |
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Processes in image formation |
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41 | (2) |
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41 | (2) |
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Some typical images from a STEM |
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43 | (4) |
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43 | (1) |
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Annular dark field STEM images |
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43 | (3) |
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Secondary electron and Auger images |
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46 | (1) |
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47 | (4) |
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47 | (1) |
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47 | (1) |
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48 | (2) |
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Scattering inside specimens |
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50 | (1) |
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50 | (1) |
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50 | (1) |
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51 | (1) |
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Relationships with diffraction |
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52 | (1) |
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53 | (1) |
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54 | (1) |
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5. Diffraction in the STEM |
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55 | (14) |
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55 | (2) |
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55 | (1) |
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56 | (1) |
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Selected area diffraction |
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57 | (5) |
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57 | (1) |
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Selected area diffraction in TEM |
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58 | (1) |
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Selected area diffraction in STEM |
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58 | (3) |
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Post-specimen compression |
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61 | (1) |
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Other types of diffraction pattern |
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62 | (3) |
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Convergent beam electron diffraction (CBED) |
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62 | (2) |
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64 | (1) |
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High resolution STEM imaging |
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65 | (2) |
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67 | (1) |
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68 | (1) |
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6. Microanalysis in the STEM |
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69 | (22) |
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69 | (1) |
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Energy dispersive X-ray microanalysis in the STEM |
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70 | (2) |
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70 | (1) |
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71 | (1) |
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72 | (1) |
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72 | (3) |
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74 | (1) |
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75 | (1) |
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Coherent bremsstrahlung (CB) |
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75 | (1) |
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Quantitative X-ray microanalysis |
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75 | (2) |
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Cliff-Lorimer thin film method |
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75 | (1) |
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76 | (1) |
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76 | (1) |
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77 | (3) |
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79 | (1) |
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79 | (1) |
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80 | (1) |
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Electron energy-loss spectroscopy |
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80 | (1) |
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Energy loss spectrometers |
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81 | (3) |
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Interfacing to the microscope |
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82 | (1) |
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83 | (1) |
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84 | (2) |
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Details of the energy loss spectrum |
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86 | (3) |
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87 | (1) |
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88 | (1) |
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Specimen thickness effects |
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89 | (1) |
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89 | (1) |
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90 | (1) |
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90 | (1) |
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91 | (6) |
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91 | (1) |
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X-ray mapping (including linescans) |
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91 | (4) |
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92 | (2) |
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94 | (1) |
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High-angle annular dark-field imaging (HAADFI) |
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95 | (2) |
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8. Limits to STEM and advanced STEM |
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97 | (8) |
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Limits to microprobe analysis |
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97 | (1) |
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98 | (1) |
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99 | (1) |
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100 | (1) |
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100 | (1) |
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Beam damage and drilling holes |
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101 | (4) |
Appendices |
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105 | (6) |
Appendix A: Glossary |
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105 | (4) |
Appendix B: Further reading |
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109 | (2) |
Index |
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111 | |