Nanoscale Phenomena in Ferroelectric Thin Films

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Format: Hardcover
Pub. Date: 2004-01-01
Publisher(s): Kluwer Academic Pub
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Summary

Nanoscale Phenomena in Ferroelectric Thin Films presents the recent advances in the field of nanoscale science and engineering of ferroelectric thin films. It consists of two main parts: electrical characterization in nanoscale ferroelectric capacitor, and nano domain manipulation and visualization in ferroelectric materials. Well-known leading experts both in relevant academia and industry over the world (U.S., Japan, Germany, Switzerland, Korea) were invited to contribute to each chapter. The objectives of the book are to provide the reader with the information needed to 1.) build, see and manipulate domain structures; 2.) understand the unexplained macroscopic phenomena; and 3.) create ferroelectric thin film that shows novel and significantly improved physical, chemical properties and phenomena due to their nanoscale size. This forms the basis on which the existing technology can further improve its performance and/or a new and radical technology can evolve. Nanoscale ferroelectric materials, regardless of their dimensions (film, wire, island), are receiving great interests from academia and industry due to their various potential applications such as memory and storage devices (Ferroelectric Random Access Memory (FRAM), Probe-based Data Storage (PDS) System, etc), sensors (gas sensor, infrared detector, etc), and actuators (micro-mirrors, ultrasonic devices, etc). This book provides the compass to navigate the unknown sea of information related to the nanoscale phenomena occurring in ferroelectric thin films. The intended audience includes professional researchers and engineers in physics, electronics, chemistry, and materials science who are interested either in nanotechnology or ferroelectrics.

Table of Contents

List of Contributors
ix
Preface xi
Acknowledgment xiv
Part I. Electrical Characterization in Nanoscale Ferroelectric Capacitor
Testing and characterization of ferroelectric thin film capacitors
In Kyeong. Yoo
Test Circuits
3(2)
Hysteretic Property
5(4)
Capacitance and Current
9(1)
Stored Energy
9(2)
Ageing
11(2)
Fatigue
13(1)
Imprint
14(2)
Leakage Current
16(5)
Electrical Degradation
21(1)
Breakdown
22(4)
Pyroelectric Effect
26(3)
Additional tests for commercial memory cells
29(10)
References
37(2)
Size effects in ferroelectric film capacitors: role of the film thickness and capacitor size
Igor Stolichnov
Introduction
39(1)
Size effects: role of the ferroelectric film thickness, impact of the passive layer and local charge injection
40(8)
Size effects: role of the capacitor size and impact of nonhomogeneous stress
48(6)
Conclusions and outlook
54(3)
Acknowledgements
55(1)
References
55(2)
Ferroelectric thin films for memory applications: nanoscale characterization by scanning force microscopy
Alexei Gruverman
Introduction
57(2)
Experimental Approach
59(6)
Variations in Ferroelectric Properties at the nanoscale
65(9)
PFM studies of retention behavior
74(7)
Nanoscale Leakage Current Mapping
81(2)
Conclusion
83(5)
Acknowledgment
84(1)
References
84(4)
Nanoscale domain dynamics in ferroelectric thin films
V. Nagarajan
R. Ramesh
Introduction
88(1)
Thin Film Materials and Characterization
89(3)
Polarization Relaxation at the Nanoscale
92(5)
Nanoscale Piezoelectric and Ferroelectric Behavior
97(9)
Conclusions
106(5)
Acknowledgements
107(1)
References
108(3)
Polarization switching and fatigue of ferroelectric thin films studied by PFM
Seungbum Hong
Introduction
111(3)
Polarization switching
114(12)
Fatigue: suppression of switchable polarization
126(4)
Summary and Conclusion
130(5)
Acknowledgments
131(1)
References
131(4)
Part II. Nano Domain Manipulation and Visualization in Ferroelectric Materials
Domain switching and self-polarization in perovskite thin films
A. Roelofs
K. Szot
R. Waser
Introduction
135(1)
PTO polycrystalline thin films on platinized silicon wafers
136(4)
PTO single grains
140(2)
Epitaxial PZT thin films on STO/LSCO
142(4)
The origin of self-polarization
146(11)
References
153(4)
Dynamic-contact electrostatic force microscopy and its application to ferroelectric domain
Z. G. Khim
J. Hong
Introduction
157(3)
Detection Mechanism of DC-EFM
160(5)
Observation of Ferroelectric Domains
165(9)
Control of ferroelectric domains
174(5)
Conclusion
179(4)
Acknowledgements
181(1)
References
181(2)
Polarization and charge dynamics in ferroelectric materials with SPM
S. Kalinin
D. A. Bonnell
Introduction
183(2)
Principles of Non-contact Electrostatic SPMs
185(1)
Domain Structure Reconstruction from SPM
186(3)
Origins of Domain Contrast in EFM and SSPM
189(7)
Polarization and Charge Dynamics on the BaTiO3 (100) Surface
196(8)
Screening and Thermodynamics of Adsorption on BaTiO3 (100) Surfaces
204(5)
Domain Selective Photochemical Activity on Ferroelectric Surfaces
209(5)
Conclusions
214(5)
Acknowledgements
215(1)
References
215(4)
Nanoscale investigation of MOCVD-Pb(Zr,Ti)O3 thin films using scanning probe microscopy
Hironori Fujisawa
Masaru Shimizu
Introduction
219(1)
Experimental procedure
220(2)
Local Current Flow of PZT Thin Films
222(3)
Crystalline Structure and Ferroelectric Properties of Nanosized PZT Islands
225(3)
Polarization Switching Processes in Epitaxial PZT Thin Films
228(6)
Conclusions
234(5)
Acknowledgements
235(1)
References
235(4)
SPM measurements of ferroelectrics at MHz frequencies
Bryan. D. Huey
Introduction
239(1)
Sensitivity to cantilever Loading
240(8)
Periodic excitation and detection
248(4)
MHz measurement Techniques at the Nanoscale
252(11)
Acknowledgements
261(1)
References
261(2)
Application of ferroelectric domains in nanometer scale for highdensity storage devices
Hyunjung Shin
Introduction
263(2)
MEMS technology and Probe-based storage systems
265(5)
Ferroelectric Domain writing and reading in nanometer scale
270(5)
Research Issues and perspective of ferroelectric domains for storage applications
275(1)
Summary and conclusions
276(1)
Acknowledgments
276(1)
References
277

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