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ix | |
| Preface |
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xi | |
| Acknowledgment |
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xiv | |
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Part I. Electrical Characterization in Nanoscale Ferroelectric Capacitor |
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Testing and characterization of ferroelectric thin film capacitors |
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3 | (2) |
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5 | (4) |
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9 | (1) |
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9 | (2) |
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11 | (2) |
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13 | (1) |
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14 | (2) |
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16 | (5) |
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21 | (1) |
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22 | (4) |
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26 | (3) |
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Additional tests for commercial memory cells |
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29 | (10) |
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37 | (2) |
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Size effects in ferroelectric film capacitors: role of the film thickness and capacitor size |
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39 | (1) |
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Size effects: role of the ferroelectric film thickness, impact of the passive layer and local charge injection |
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40 | (8) |
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Size effects: role of the capacitor size and impact of nonhomogeneous stress |
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48 | (6) |
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54 | (3) |
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55 | (1) |
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55 | (2) |
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Ferroelectric thin films for memory applications: nanoscale characterization by scanning force microscopy |
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57 | (2) |
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59 | (6) |
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Variations in Ferroelectric Properties at the nanoscale |
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65 | (9) |
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PFM studies of retention behavior |
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74 | (7) |
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Nanoscale Leakage Current Mapping |
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81 | (2) |
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83 | (5) |
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84 | (1) |
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84 | (4) |
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Nanoscale domain dynamics in ferroelectric thin films |
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88 | (1) |
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Thin Film Materials and Characterization |
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89 | (3) |
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Polarization Relaxation at the Nanoscale |
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92 | (5) |
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Nanoscale Piezoelectric and Ferroelectric Behavior |
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97 | (9) |
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106 | (5) |
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107 | (1) |
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108 | (3) |
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Polarization switching and fatigue of ferroelectric thin films studied by PFM |
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111 | (3) |
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114 | (12) |
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Fatigue: suppression of switchable polarization |
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126 | (4) |
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130 | (5) |
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131 | (1) |
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131 | (4) |
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Part II. Nano Domain Manipulation and Visualization in Ferroelectric Materials |
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Domain switching and self-polarization in perovskite thin films |
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135 | (1) |
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PTO polycrystalline thin films on platinized silicon wafers |
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136 | (4) |
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140 | (2) |
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Epitaxial PZT thin films on STO/LSCO |
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142 | (4) |
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The origin of self-polarization |
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146 | (11) |
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153 | (4) |
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Dynamic-contact electrostatic force microscopy and its application to ferroelectric domain |
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157 | (3) |
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Detection Mechanism of DC-EFM |
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160 | (5) |
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Observation of Ferroelectric Domains |
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165 | (9) |
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Control of ferroelectric domains |
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174 | (5) |
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179 | (4) |
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181 | (1) |
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181 | (2) |
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Polarization and charge dynamics in ferroelectric materials with SPM |
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183 | (2) |
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Principles of Non-contact Electrostatic SPMs |
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185 | (1) |
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Domain Structure Reconstruction from SPM |
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186 | (3) |
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Origins of Domain Contrast in EFM and SSPM |
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189 | (7) |
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Polarization and Charge Dynamics on the BaTiO3 (100) Surface |
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196 | (8) |
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Screening and Thermodynamics of Adsorption on BaTiO3 (100) Surfaces |
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204 | (5) |
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Domain Selective Photochemical Activity on Ferroelectric Surfaces |
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209 | (5) |
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214 | (5) |
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215 | (1) |
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215 | (4) |
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Nanoscale investigation of MOCVD-Pb(Zr,Ti)O3 thin films using scanning probe microscopy |
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219 | (1) |
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220 | (2) |
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Local Current Flow of PZT Thin Films |
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222 | (3) |
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Crystalline Structure and Ferroelectric Properties of Nanosized PZT Islands |
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225 | (3) |
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Polarization Switching Processes in Epitaxial PZT Thin Films |
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228 | (6) |
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234 | (5) |
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235 | (1) |
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235 | (4) |
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SPM measurements of ferroelectrics at MHz frequencies |
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239 | (1) |
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Sensitivity to cantilever Loading |
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240 | (8) |
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Periodic excitation and detection |
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248 | (4) |
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MHz measurement Techniques at the Nanoscale |
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252 | (11) |
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261 | (1) |
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261 | (2) |
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Application of ferroelectric domains in nanometer scale for highdensity storage devices |
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263 | (2) |
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MEMS technology and Probe-based storage systems |
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265 | (5) |
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Ferroelectric Domain writing and reading in nanometer scale |
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270 | (5) |
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Research Issues and perspective of ferroelectric domains for storage applications |
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275 | (1) |
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276 | (1) |
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276 | (1) |
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277 | |